Appearance: No damage L change: within ±5% Q change: within ±10%
Test device shall be soldered on the substrate Oscillation Frequency: 10 to 55 to 10Hz for 1min Amplitude: 1.5mm Time: 2hrs for each axis (X, Y & Z), total 6hrs
1 lbs. For 0402 2 lbs. For 0603 3 lbs. For the rest
The device should be soldered (260±5°C for 10 seconds) to a tinned copper subs rate. A dynamiter force gauge should be applied to the side of the component. The device must with stand a minimum force of 2 or 4 pounds without a failure of adhesion on termination
Drop Test
No damage
Dropping chip by each side and each corner. Drop 10 times in total Drop height: 100cm Drop weight: 125g
Solderability Test
90% covered with solder.
Inductor shall be dipped in a melted solder bath at 235±5°C for 5 seconds.
Resistance to Solvent Test
No damage on appearance and marking.
MIL-STD202F, Method 215D
Mechanical Performance Test
Item
Specification
Test Method
Inductance
Refer to standard electrical characteristic spec.
HP4291B
Q
HP4291B
SRF
HP8753D
DC Resistance RDC
Micro-Ohm meter (Gom-801G)
Rated Current IDC
Applied the current to coils, The inductance change should be less than 10% to initial value
Over Load Test
Inductors shall have no evidence of electrical and mechanical damage
Applied 2 times of rated allowed DC current to inductor for a period of 5 minute
Withstanding Voltage Test
Inductors shall be no evidence of electrical and mechanical damage.
AC voltage of 500 VAC applied between inductors terminal and case for 1 minute.
Insulation Resistance Test
1000M ohm min
100 VDC applied between inductor terminal and case
Climatic Test
Item
Specification
Test Method
Temperature Characteristic
Appearance: No damage L change: within ±10% Q change: within ±20%
-40°C~+125°C
Humidity Resistance
Temperature: 40±2°C Relative Humidity: 90~95% Time: 96hrs±2hrs Measured after exposure in the room condition for 2hrs
Low Temperature Storage Test
Temperature: -40±2°C Time: 48±2hrs Inductors are tested after 1 hour at room temperature
Thermal Shock Test
One cycle:
Step
Temperature (°C)
time (min)
1
-25±3
30
2
25±2
15
3
85±3
30
4
25±2
15
Total: 5 cycles
High Temperature Storage Test
Temperature: 125±2°C Time: 48±2hrs Measured after exposure in the room condition for 1hr
High Temperature Load Life Test
There should be no evidence of short of open circuit.
Temperature: 85±2°C Time: 1000±12hrs Load: Allowed DC current
Humidity Load Life
Temperature: 40±2°C Relative Humidity: 90~95% Time: 1000±12hrs Load: Allowed DC current