| 11 - 20 of about 21 for JIS. |
Precision Chip Resistors
JIS-C-5202-5.5 RCWV*2.5 or Max Overloading Voltage, 5 seconds. , ΔR±0.5% for high power rating , Dielectric Withstand Voltage , By type , MIL ... JIS-C-5202-7.2 96 hours @ +155°C without load , Low Temperature Operation , ΔR±0.05% , ΔR±0.2% , JIS-C-5202-7.1 1hour, -65& ... ...
Anti-Corrosive Thin Film Precision Chip Resistor
JIS-C-5202-7.2 1000 hours @ +125°C without load , Resistance to Soldering Heat , ≤ ±0.02% , ≤ ±0.1% , MIL-STD-202F Method 210E ...
Thick Film Chip Resistor
reflow and flow soldering, reference standards JIS C 5202. , Direct offers several sizes of thick film chip resistor in standard values for most market requirements. These products provide designers ...
Chip Current Sensing Resistors (SMD)
JIS-C-5202-5.5RCWV*2.5 or Max Overloading Voltage, 5 seconds , Resistance to Dry Heat , ±1%+0.5mΩ , ±1% , JIS-C-5202-7.296 hours @ + ...
Spirit of Direct - Direct Company Profile
Our production and testing processes meet JIS standards, because the , whole thing is monitored step by step. Our strong research and develoption , ensures that you have access to the latest ...
Resistor Glossary
resistors for five seconds in the overload test. (JIS C 5201- , 1 4.13) Typically the applied voltage in the short time overload test , shall be 2.5 times larger than the rated voltage. However, it ... in the dielectric withstanding voltage test. (JIS C 5201- 1 4.7) , Rated Ambient Temperature , The maximum ambient temperature at which resistors are capable of , being used continuously with the ...
Precision Resistors
JIS C 5202 , MIL-R-10509F , Operating Temp.Range , -55°C ~ 155°C , , , Temp Coefficient (°C ) , ±25 ±50 ± ...
Metal Oxide Resistors
JIS C 5202 , MIL-R-22684B , Operating Temp.Range , -55°C~200°C , , , Temp.Coefficient (ppm C) , ± 300 , 5.2 , 4.6.11 , ...
SMD RF Wirewound Inductor
TEST METHOD(JIS C 5321) , Resistance to Soldering Heat , No evidence of damage Δ L/L shall be within ±3% , Immerse in the solder (H63A)of 260±5& ... TEST METHOD(JIS C 5321) , LOW TEMP. Characteristics , No evidence of damage, Δ L/L within ±5%, Q/Q within ±30% , Immerse in the solder (H63A)of ...
Chip Wirewound Inductor
TEST METHOD(JIS C 5321) , Resistance to Soldering Heat , No evidence of damage Δ L/L shall be within ±3% , Immerse in the solder (H63A)of 260±5& ... TEST METHOD(JIS C 5321) , LOW TEMP. Characteristics , No evidence of damage, Δ L/L within ±5%, Q/Q within ±30% , Immerse in the solder (H63A)of ...